We use a CARL ZEISS EVO MA15 microscope with an OXFORD X-MaxN x-ray analyser.
Particle analysis in our SEM is easier, faster, and more accurate, with an innovative particle analysis system developed in-house specifically optimised for usability and high-speed turnover. It combines the raw speed and sensitivity of the X-MaxN Silicon Drift Detector with the superior analytical performance and ease of use of the EDS analysis suite to create the most advanced automated particle analysis available.
Using a guided workflow and intelligent algorithms, we can characterise thousands of particles that may be present over large sample areas. Reports on particle position, morphology and chemical composition are automatically produced moments later.
|Magnification||Up to 300,000x||1000x|
|Electron images and elemental composition||Topographic High resolution pictures||No|
|Automated analysis||Fully Automated||No|
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